The research interest in halide perovskites has gained momentum enormously over the last recent years, also due to the demonstration of high-efficient perovskite-based optoelectronic devices. A prerequisite for such highly efficient devices is to realize high-quality perovskite layers, which requires a deep understanding about the perovskite formation and good process control. In that context, in situ optical spectroscopy during the processing of halide perovskites has become increasingly popular. Even though it is a relatively easily accessible yet powerful tool for studying perovskite formation, there exist some technical and analytical aspects that need to be considered to unfold its full potential. In this Perspective, we give an overview of the latest developments in the field of in situ optical spectroscopy to control and better understand the film processing of halide perovskites. We highlight possibilities and pitfalls regarding the analysis of measured optical data, discuss the development of technical concepts, and address future prospects of optical in situ spectroscopy.